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 question selection algorithm




Balancing Test Accuracy and Security in Computerized Adaptive Testing

arXiv.org Artificial Intelligence

Computerized adaptive testing (CAT) is a form of personalized testing that accurately measures students' knowledge levels while reducing test length. Bilevel optimization-based CAT (BOBCAT) is a recent framework that learns a data-driven question selection algorithm to effectively reduce test length and improve test accuracy. However, it suffers from high question exposure and test overlap rates, which potentially affects test security. This paper introduces a constrained version of BOBCAT to address these problems by changing its optimization setup and enabling us to trade off test accuracy for question exposure and test overlap rates. We show that C-BOBCAT is effective through extensive experiments on two real-world adult testing datasets.


BOBCAT: Bilevel Optimization-Based Computerized Adaptive Testing

arXiv.org Artificial Intelligence

Computerized adaptive testing (CAT) refers to a form of tests that are personalized to every student/test taker. CAT methods adaptively select the next most informative question/item for each student given their responses to previous questions, effectively reducing test length. Existing CAT methods use item response theory (IRT) models to relate student ability to their responses to questions and static question selection algorithms designed to reduce the ability estimation error as quickly as possible; therefore, these algorithms cannot improve by learning from large-scale student response data. In this paper, we propose BOBCAT, a Bilevel Optimization-Based framework for CAT to directly learn a data-driven question selection algorithm from training data. BOBCAT is agnostic to the underlying student response model and is computationally efficient during the adaptive testing process. Through extensive experiments on five real-world student response datasets, we show that BOBCAT outperforms existing CAT methods (sometimes significantly) at reducing test length.